ICCAD : G : Fast Statistical Analysis of Rare Circuit Failure Events in High-Dimensional Variation Space
نویسندگان
چکیده
As integrated circuit (IC) technology advances, the ever increasing process variation has become a growing concern [1]. A complex IC, containing numerous circuit components (e.g., millions of SRAM bit-cells integrated in an advanced microprocessor), is required to meet the design specification not only at the nominal process corner, but also under large-scale process variations. To achieve sufficiently high yield, the failure rate of each individual circuit component must be extremely small. For instance, the failure rate of an SRAM bit-cell must be less than 10~10 for a typical SRAM design [2]-[3]. Due to this reason, efficiently analyzing the rare failure events for individual circuit components becomes an important task for the IC design community.
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